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5X E-beam ASML reticle mask: View
Process Hierarchy
Bonding
Clean
Consulting
Deposition
Doping
Etch
LIGA
Lift off
Lithography
Mask making
Metrology
Miscellaneous
Packaging
Polishing
Process technologies
Thermal
Unique capabilities
If you are interested in this process, either by itself or as part of a longer processing sequence, please send us email at
engineering@mems-exchange.org
or call us at (703) 262-5368
5X E-beam ASML reticle mask
Process characteristics:
Beam spot diameter
Area of the beam used to write the mask
Beam spot diameter
*
0.1 um
0.25 um
0.5 um
Area of the beam used to write the mask
Defect density
Density (by area) of defects of a given size (e.g.,
[email protected]
).
Defect density
*
1.5um@1DPSI
1um@1DPSI
Density (by area) of defects of a given size (e.g.,
[email protected]
).
Batch size
1
Critical dimension tolerance
0.25 µm
Magnification
5
Mask coating
Mask coating material (eg. chrome).
chromium
Mask material
quartz (fused silica)
Mask plate dimension
6x6x0.25"
Equipment
Comments:
For a 2um feature a 0.25um beam diameter or smaller is recommended.
5X ASML 5500/90
Pricing includes 90 minutes of write time. Charge over 90 minutes is $12.00 per minute, not to exceed 1x base price.